Taoyuan, Taiwan

Sh-Pei Yang

This inventor holds 1 USPTO granted patent. Top assignee: Touch Micro-System Technology Corp.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sh-Pei Yang. Retrieved from https://idiyas.com/inventor/sh-pei-yang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Sh-Pei Yang: Innovator in Edge Bevel Rinse Technology

Introduction

Sh-Pei Yang is a notable inventor based in Tao-Yuan Hsien, Taiwan. He has made significant contributions to the field of semiconductor processing, particularly with his innovative methods for enhancing wafer treatment.

Latest Patents

Sh-Pei Yang holds a patent for a method of edge bevel rinse. This method involves providing a wafer with a coating material layer. A light beam is then optically projected onto the wafer to create a reference pattern. This reference pattern defines a central region and a bevel region surrounding the central region on the wafer's surface. The coating material layer in the bevel region is subsequently removed according to the reference pattern. This innovative approach improves the efficiency and effectiveness of wafer processing.

Career Highlights

Sh-Pei Yang is associated with Touch Micro-system Technology Corp., where he applies his expertise in semiconductor technology. His work has been instrumental in advancing the methods used in the industry, particularly in the area of wafer treatment.

Collaborations

Sh-Pei Yang collaborates with Shih-Min Huang, who is also a key figure in their projects. Their combined efforts contribute to the ongoing advancements in their field.

Conclusion

Sh-Pei Yang's contributions to the semiconductor industry, particularly through his patented method of edge bevel rinse, highlight his innovative spirit and dedication to improving technology. His work continues to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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