Company Filing History:
Years Active: 2016-2017
Title: Innovations of Seung Wook Lee in Wafer Measurement Technology
Introduction
Seung Wook Lee is a notable inventor based in Gyeongbuk, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of impurities on wafers. With a total of two patents to his name, his work is crucial for enhancing the quality and reliability of semiconductor manufacturing processes.
Latest Patents
Seung Wook Lee's latest patents focus on an apparatus and method for measuring impurities on a wafer. The apparatus includes several key components: a wafer aligning device for precise alignment, a loading robot for moving and loading the aligned wafer, and a rotation stage for rotating the loaded wafer. Additionally, a scan robot is designed to hold a natural oxide layer etching solution and a metallic impurity recovery solution. This innovative setup allows the scan robot to effectively remove an oxide layer from the edge region of the wafer, ensuring accurate measurements of impurities.
Career Highlights
Seung Wook Lee is currently associated with LG Siltron Incorporated, a company known for its advancements in semiconductor materials. His role at the company allows him to apply his innovative ideas and contribute to the development of cutting-edge technologies in the semiconductor industry.
Collaborations
Due to space constraints, the collaborations section will be omitted.
Conclusion
Seung Wook Lee's contributions to wafer measurement technology exemplify the importance of innovation in the semiconductor industry. His patents not only enhance the measurement processes but also pave the way for improved semiconductor manufacturing practices.