Seung Min Shin

Title: Seung Min Shin: Innovator in Noise Selection Technology

Introduction

Seung Min Shin, a distinguished inventor from Yongin-si, South Korea, has made significant contributions to the field of signal processing. His innovative approach focuses on the selection of sub-bands for white Gaussian noise, utilizing advanced mathematical techniques for enhanced measurement accuracy.

Latest Patents

One of Seung Min Shin's notable patents is titled "System and method of selecting white Gaussian noise sub-band using singular value decomposition." This patent outlines a method for selecting a white Gaussian noise sub-band by employing singular value decomposition (SVD). The process includes selecting a first frequency band, verifying the inclusion of a signal in that band, and subsequently measuring background radio noise in a target measurement frequency. This innovation represents a substantial advancement in noise measurement and analysis techniques.

Career Highlights

Throughout his career, Seung Min Shin has worked at reputable organizations such as the Electronics and Telecommunications Research Institute, where he contributed to various signal processing projects. Additionally, he was a part of the University-Industry Cooperation Group at Kyung Hee University, focusing on collaborations that bridge academic research and practical technological applications.

Collaborations

Seung Min Shin has had the privilege of collaborating with notable professionals in his field, including Mi-Kyung Suk and Sang Tae Kim. These partnerships have facilitated advancements in their collective work, particularly in the realm of telecommunications and signal processing.

Conclusion

Seung Min Shin stands as an influential figure in the field of signal processing, particularly through his innovative patent on noise selection methodology. His collaborations and extensive experience in esteemed institutions underscore his commitment to advancing technology in this domain. As researchers and industries continue to face challenges in signal measurement, Shin’s contributions provide valuable solutions for the future.