The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Mar. 30, 2010
Applicants:

Mi-kyung Suk, Daegu, KR;

Sang Tae Kim, Daejeon, KR;

Gwangmoon Park, Daejeon, KR;

Seong Yun Lee, Daejeon, KR;

Haeng Sook RO, Daejeon, KR;

Heung Yong Kang, Daejeon, KR;

Yong-seok Choi, Daejeon, KR;

Young Soo Kim, Yongin-si, KR;

Seung Min Shin, Yongin-si, KR;

Inventors:

Mi-Kyung Suk, Daegu, KR;

Sang Tae Kim, Daejeon, KR;

Gwangmoon Park, Daejeon, KR;

Seong Yun Lee, Daejeon, KR;

Haeng Sook Ro, Daejeon, KR;

Heung Yong Kang, Daejeon, KR;

Yong-Seok Choi, Daejeon, KR;

Young Soo Kim, Yongin-si, KR;

Seung Min Shin, Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0055 (2013.01);
Abstract

Provided is a method of selecting a white Gaussian noise sub-band using singular value decomposition (SVD). The method includes selecting a first frequency band, verifying whether a signal is included in the selected first frequency band, determining the first frequency band as a target measurement frequency when the signal is not included in the selected first frequency band, and measuring a background radio noise in the determined target measurement frequency.


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