Seattle, WA, United States of America

Seung-Hwan Baek

This inventor holds 1 USPTO granted patent. Top assignee: University of Washington. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seung-Hwan Baek. Retrieved from https://idiyas.com/inventor/seung-hwan-baek-u2nh0lt2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Seung-Hwan Baek: Innovator in Neural Nano-Optics

Introduction

Seung-Hwan Baek is a prominent inventor based in Seattle, WA (US). He has made significant contributions to the field of imaging technology through his innovative work on neural nano-optics.

Latest Patents

Baek holds a patent for "Neural nano-optics for high-quality thin lens imaging." This patent describes metasurfaces and systems that include metasurfaces for imaging, along with methods of imaging. In one embodiment, the method for acquiring images by an imaging system comprising a metalens includes illuminating the metalens, acquiring light passing through the metalens as a first image by an image sensor, and processing the first image into a second image that is a deconvolved version of the first image by a post-processing engine. The metalens consists of a plurality of nanoposts carried by a substrate.

Career Highlights

Baek is affiliated with the University of Washington, where he continues to advance his research and development in imaging technologies. His work has garnered attention for its potential applications in various fields.

Collaborations

Some of his notable coworkers include Arka Majumdar and Shane Colburn, who have collaborated with him on various projects related to imaging and optics.

Conclusion

Seung-Hwan Baek's innovative contributions to neural nano-optics and imaging technology highlight his role as a leading inventor in his field. His work continues to pave the way for advancements in high-quality imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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