Tokyo, Japan

Setuta Setogawa

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Heavy Industries Limited. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Setuta Setogawa. Retrieved from https://idiyas.com/inventor/setuta-setogawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Setuta Setogawa: Innovator in X-ray Technology

Introduction

Setuta Setogawa is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of medical imaging technology. His innovative work has led to the development of advanced X-ray CT apparatuses that enhance diagnostic capabilities.

Latest Patents

Setogawa holds a patent for an X-ray CT apparatus. This apparatus comprises a large number of X-ray sources, a detector, and a collimator. The X-ray sources are strategically arranged around an object of inspection. The detector is responsible for detecting X-rays emitted from the X-ray sources. The collimator is positioned between the X-ray sources and the object of inspection, restricting the angle of emission of the X-rays to match the size of the detection surface of the detector. He has 1 patent to his name.

Career Highlights

Setuta Setogawa is associated with Mitsubishi Heavy Industries Limited, where he has made significant strides in the development of X-ray technology. His work has been instrumental in improving the efficiency and accuracy of medical imaging.

Collaborations

Setogawa has collaborated with notable colleagues, including Kazumasa Mihara and Keiichi Hori. Their combined expertise has contributed to advancements in the field of X-ray technology.

Conclusion

Setuta Setogawa's innovative contributions to X-ray technology have made a lasting impact on medical imaging. His work continues to influence the industry and improve diagnostic processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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