Setsuo Nomura is a prominent inventor based in Nishitama, Japan. He has made significant contributions to the field of microscopy and imaging technology. With a total of 7 patents to his name, Nomura's work has advanced the capabilities of three-dimensional imaging in micro-scale applications.

Latest Patents

Among his latest patents is the "Scanning Charged Particle Microscope" and the "Focal Distance Adjusting Method and Astigmatism Correction Method Thereof." This innovative apparatus is designed for working with specimens and aims to produce highly accurate three-dimensional images of solids at the micro level. The apparatus consists of an ion column, an electron column, a specimen chamber, a specimen stage, a diluent gas ion column, and a control system. The advantages of this apparatus include the ability to provide correct three-dimensional information even for composite materials, accurate measurement of worked dimensions, storage of multiple images for a single specimen, and the use of a side entry stage that allows for close positioning of the working and observation columns.

Career Highlights

Setsuo Nomura is currently employed at Hitachi, Ltd., where he continues to innovate and develop advanced imaging technologies. His work has been instrumental in enhancing the precision and accuracy of three-dimensional observations in various scientific fields.

Collaborations

Nomura has collaborated with notable colleagues such as Shigeto Isakozawa and Tadashi Hayashi. Their combined expertise has contributed to the success of various projects and advancements in microscopy.

Conclusion

Setsuo Nomura's contributions to the field of microscopy and imaging technology have established him as a leading inventor in Japan. His innovative patents and ongoing work at Hitachi, Ltd. continue to push the boundaries of what is possible in three-dimensional imaging.

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