Rotterdam, Netherlands

Sergio Curto

This inventor holds 1 USPTO granted patent. Top assignee: Kansas State University Research Foundation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sergio Curto. Retrieved from https://idiyas.com/inventor/sergio-curto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sergio Curto and MRI-Guided Hyperthermia Treatment.

Introduction

Sergio Curto is an inventor associated with Rotterdam, Netherlands, and the Kansas State University Research Foundation. His work includes an invention designed to support targeted, image-guided hyperthermia treatments.

Latest Patents

Curto is associated with 1 patent: “System for Delivering Hyperthermia Treatments.” The patent describes an apparatus and methods for delivering in vivo hyperthermia treatments. The system combines an imaging device, such as an MRI scanner, with a microwave applicator and a controller. The applicator directs microwave energy toward selected tissue, while imaging provides real-time information about applicator position and tissue temperature. This feedback allows operators to adjust the applicator’s operating parameters during treatment.

Career Highlights

Curto’s listed patent work focuses on integrating imaging, microwave energy, and real-time feedback to guide hyperthermia treatment. The invention aims to help target specific tissues and monitor treatment conditions as they change.

Collaborations

The provided information lists Punit Prakash and Stefan H. Bossmann as Curto’s coworkers. The patent is associated with the Kansas State University Research Foundation.

Conclusion

Sergio Curto’s patent describes an image-guided approach to hyperthermia treatment that combines targeted microwave delivery with real-time monitoring and adjustment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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