Toronto, Canada

Sergey Kapitoulsky

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Smiths Detection Inc.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sergey Kapitoulsky. Retrieved from https://idiyas.com/inventor/sergey-kapitoulsky

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0



Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Sergey Kapitoulsky: Innovator in Sampling Technology

Introduction

Sergey Kapitoulsky is a notable inventor based in Toronto, Canada. He has made significant contributions to the field of sampling technology, particularly with his innovative apparatus designed to enhance the efficiency and accuracy of sample collection.

Latest Patents

Kapitoulsky holds a patent for a sampling device that provides a method of obtaining a sample. The apparatus features a body, a head connected to the body, and a mechanism for retaining a substrate on the head. This design allows for quick and efficient sampling while minimizing cross-contamination and ensuring correct placement of samples in analyzers. He has 1 patent to his name.

Career Highlights

Throughout his career, Kapitoulsky has worked with Smiths Detection Inc., where he contributed to advancements in detection technologies. His role at the Toronto branch of the company further solidified his expertise in the field.

Collaborations

Kapitoulsky has collaborated with notable professionals such as Sabatino Nacson and Yuri Wiseman, enhancing his work through shared knowledge and experience.

Conclusion

Sergey Kapitoulsky's innovative contributions to sampling technology demonstrate his commitment to improving efficiency and accuracy in sample collection. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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