This inventor holds 1 USPTO granted patent. Top assignees: Loma Linda University, Yeda, Ltd.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2006
Title: The Innovations of Sergei Shchemelinin
Introduction
Sergei Shchemelinin is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of radiation detection through his innovative work. His expertise is particularly evident in his patented invention, which addresses the detection of positive ions in radiation fields.
Latest Patents
Sergei Shchemelinin holds a patent for a device known as a nanodosimeter based on single ion detection. This nanodosimeter is designed to detect positive ions induced in a sensitive gas volume by a radiation field of primary particles. The device comprises an ionization chamber for holding the sensitive gas, an ion counter system for detecting positive ions, a particle tracking system for position-sensitive detection, and a data acquisition system for coordinating data signals and analysis. This invention also includes a method for calibrating radiation exposure with damage to nucleic acids within a sample.
Career Highlights
Throughout his career, Sergei has worked with reputable institutions such as Loma Linda University and Yeda, Ltd. His work has focused on advancing the technology used in radiation detection and measurement. His contributions have been instrumental in enhancing the understanding of radiation effects on biological samples.
Collaborations
Sergei has collaborated with notable professionals in his field, including Vladimir A Bashkirov and Reinhard W Schulte. These collaborations have further enriched his research and development efforts.
Conclusion
Sergei Shchemelinin's innovative work in the field of radiation detection exemplifies the impact of dedicated inventors on scientific advancements. His patented nanodosimeter represents a significant step forward in understanding radiation exposure and its effects on biological materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile