Seong-Jin Choi

Title: Seong-Jin Choi: Innovator in Glass Substrate Measurement

Introduction

Seong-Jin Choi is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of optical measurement, particularly in the assessment of glass substrates. His innovative approach has led to the development of a unique system that enhances the accuracy of measuring irregularities in glass surfaces.

Latest Patents

Choi holds a patent for a "System and method of measuring irregularity of a glass substrate." This invention utilizes reflection light from both the upper and lower surfaces of the glass substrate to determine its irregularity. The system comprises a light source that emits a first light to the glass substrate, which is then reflected back to a screen. The first reflection light creates a line on the screen, while the second reflection light, which passes through the upper surface, forms another line. This innovative method allows for precise measurement of glass substrate irregularities.

Career Highlights

Seong-Jin Choi is associated with Semisysco Co., Ltd., where he applies his expertise in optical measurement technologies. His work has been instrumental in advancing the capabilities of glass substrate analysis, making significant strides in the industry.

Collaborations

Choi has collaborated with esteemed colleagues, including Soon-Jong Lee and Bong-Joo Woo. Their combined efforts have contributed to the development of cutting-edge technologies in the field.

Conclusion

Seong-Jin Choi's contributions to the measurement of glass substrates exemplify the impact of innovative thinking in technology. His patent reflects a significant advancement in optical measurement techniques, showcasing his role as a leading inventor in this specialized field.