Siheung, South Korea

Seong Cheol Ji

This inventor holds 1 USPTO granted patent. Top assignee: Ani. Co. Ltd. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seong Cheol Ji. Retrieved from https://idiyas.com/inventor/seong-cheol-ji

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Seong Cheol Ji: Innovator in Brightness Colorimetry

Introduction

Seong Cheol Ji is a notable inventor based in Siheung Si, South Korea. He has made significant contributions to the field of colorimetry, particularly with his innovative designs that address measurement errors in brightness colorimeters.

Latest Patents

His most recent patent is titled "Brightness colorimeter having measurement error caused by linearly polarized light, which is corrected." This invention includes a lens module that receives light from one side, a polarization conversion module that alters the polarization characteristics of the light, and a spectral module that reflects and intersects the light to branch it into three different directions. Additionally, filter modules are arranged to isolate monochromatic light beams with specific spectra, and measurement modules are designed to assess brightness, chromaticity, and errors from the monochromatic light beams.

Career Highlights

Seong Cheol Ji is currently employed at Ani Co. Ltd., where he continues to develop innovative solutions in the field of colorimetry. His work has been instrumental in enhancing the accuracy and reliability of brightness measurements.

Collaborations

He collaborates with talented coworkers, including Kyu Ho Lee and Kyu Seok Kim, who contribute to the innovative projects at Ani Co. Ltd.

Conclusion

Seong Cheol Ji's contributions to brightness colorimetry exemplify the importance of innovation in scientific measurement. His work not only addresses existing challenges but also paves the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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