Gyeonggi-do, South Korea

Seokmin Kim

This inventor holds 1 USPTO granted patent. Top assignee: Tmaxdata Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seokmin Kim. Retrieved from https://idiyas.com/inventor/seokmin-kim-3ygotv91

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Seokmin Kim: Innovator in Calibration Technology

Introduction

Seokmin Kim is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of calibration technology, particularly through his innovative methods that enhance the accuracy of image acquisition devices.

Latest Patents

Seokmin Kim holds a patent for a "Method for Calibration." This patent describes a computer program stored in a computer-readable storage medium. The program enables processors to perform various operations for calibration, including inputting an image to an object detection model, acquiring bounding box information on detected objects, and calibrating an image acquisition device based on this information. He has 1 patent to his name.

Career Highlights

Seokmin Kim is currently employed at Tmaxdata Co., Ltd., where he continues to develop and refine his innovative ideas. His work focuses on improving calibration methods that are essential for various technological applications.

Collaborations

Some of his coworkers include Jaemin Seo and Seungkeol Kim, who contribute to the collaborative environment at Tmaxdata Co., Ltd. Their teamwork fosters innovation and drives advancements in their respective fields.

Conclusion

Seokmin Kim's contributions to calibration technology exemplify the impact of innovative thinking in enhancing device accuracy. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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