Company Filing History:
Years Active: 2023-2025
Title: Seokjun Jang: Innovator in Scan Chain Security
Introduction
Seokjun Jang is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of scan chain security, holding two patents that enhance the reliability and security of electronic devices.
Latest Patents
His latest patents include a "Scan Chain Security Circuit and Driving Method Thereof." This invention features a scan chain that includes at least one flip-flop and a scan path obfuscator. The obfuscator is designed to obscure the path of a pattern sequence input to the first flip-flop, responding to a control signal. Additionally, the invention includes a scan path normalizer and dummy flip-flops that work together to ensure the security of the output pattern sequence. Another significant patent is the "Scan Apparatus Capable of Fault Diagnosis and Scan Chain Fault Diagnosis Method." This device is designed to diagnose faults within scan chains, utilizing controllable connection paths to detect and reduce fault ranges effectively.
Career Highlights
Seokjun Jang is affiliated with Yonsei University, where he contributes to research and development in electronic security technologies. His work has been instrumental in advancing the understanding and implementation of secure scan chain methodologies.
Collaborations
He collaborates with fellow researcher Sungho Kang, enhancing the innovative efforts within their field.
Conclusion
Seokjun Jang's contributions to scan chain security through his patents reflect his commitment to advancing technology in electronic devices. His work continues to influence the landscape of secure electronic design.