The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Dec. 26, 2023
Applicant:

Uif (University Industry Foundation), Yonsei University, Seoul, KR;

Inventors:

Sungho Kang, Seoul, KR;

Seokjun Jang, Paju-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31719 (2013.01); G01R 31/318536 (2013.01); G01R 31/318572 (2013.01);
Abstract

A scan chain security circuit includes a scan chain including at least one flip-flop, a scan path obfuscator to obfuscate a path of a pattern sequence input to at least one first flip-flop grouped at an input side of the scan chain, in response to a first control signal, a scan path normalizer to normalize the path of the pattern sequence input to at least one second flip-flop grouped at an outside of the scan chain, in response to a second control signal, at least one dummy flip-flop interposed between the at least one first flip-flop and the at least one second flip-flop to receive a test key included in the pattern sequence, and a scan data obfuscator to damage and obfuscate an output pattern sequence output from the at least one second flip-flop, depending on whether a security key stored in a memory of a chip to be inspected is matched with the test key.


Find Patent Forward Citations

Loading…