Xi'an, China

Sen Wei

This inventor holds 1 USPTO granted patent. Top assignee: Chang'an University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sen Wei. Retrieved from https://idiyas.com/inventor/sen-wei-uhh0d36q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Sen Wei

Introduction

Sen Wei is a notable inventor based in Xi'an, China. He has made significant contributions to the field of global positioning systems (GPS). His innovative approach to map matching methods has garnered attention in the technological community.

Latest Patents

Sen Wei holds a patent for an "Efficient map matching method for global positioning system (GPS) trajectory." This method involves obtaining a valid GPS point list and a current searched endpoint. It includes backtracking the best map matching path from the current searched endpoint, traversing GPS points along the path to obtain the best matching results, and summarizing these results in a statistical table. Additionally, it determines whether the current searched endpoint is a final point. He has 1 patent to his name.

Career Highlights

Sen Wei is affiliated with Chang'an University, where he continues to advance his research and development in GPS technologies. His work has implications for various applications, including navigation and location-based services.

Collaborations

Sen Wei collaborates with colleagues such as Yabin Sun and Yaxiang Li, contributing to a dynamic research environment that fosters innovation.

Conclusion

Sen Wei's contributions to GPS technology through his efficient map matching method highlight his role as a significant inventor in the field. His work continues to influence advancements in navigation systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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