Beijing, China

Sen Na

This inventor holds 1 USPTO granted patent. Top assignee: Canon Kabushiki Kaisha. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sen Na. Retrieved from https://idiyas.com/inventor/sen-na

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2019

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Sen Na in Object Indexing Technology.

Introduction

Sen Na is an accomplished inventor based in Beijing, China. He has made significant contributions to the field of object indexing technology. His innovative work has led to the development of a unique patent that enhances the efficiency of data management systems.

Latest Patents

Sen Na holds a patent for an "Object indexing method, object searching method, and object indexing system." This patent describes a method that includes initializing data containers and utilizing data indexers to manage and search for objects effectively. The process involves dividing data containers and adding input feature vectors to optimize data handling.

Career Highlights

Sen Na is associated with Canon Kabushiki Kaisha, a leading company in imaging and printing technologies. His role at Canon has allowed him to focus on advancing object indexing methods, contributing to the company's innovative solutions in data management.

Collaborations

Sen Na has worked alongside talented colleagues, including Cheng Tan and Yaohai Huang. Their collaborative efforts have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Sen Na's contributions to object indexing technology exemplify the impact of innovative thinking in data management. His patent reflects a commitment to enhancing efficiency in handling large datasets.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…