Guangzhou, China

Sen Jia

This inventor holds 1 USPTO granted patent. Top assignee: Bigo Technology Pte. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sen Jia. Retrieved from https://idiyas.com/inventor/sen-jia-ays0ypn3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sen Jia - Innovator in Model Training and Body Posture Detection

Introduction

Sen Jia is a prominent inventor based in Guangzhou, China. He has made significant contributions to the field of model training and body posture detection. His innovative approach has led to the development of a unique patent that addresses key challenges in these areas.

Latest Patents

Sen Jia holds a patent for a "Method and device for training models, method and device for detecting body postures, and storage medium." This patent outlines a method for training models that includes inputting an image training sample into a posture detection network model. The process involves acquiring a first loss function, re-projecting the current output result, and performing backpropagation to achieve effective training of the posture detection network model. This innovative method enhances the accuracy and efficiency of body posture detection.

Career Highlights

Sen Jia is currently associated with Bigo Technology Pte. Ltd., where he applies his expertise in model training and detection technologies. His work at Bigo Technology has positioned him as a key player in advancing technological solutions in the industry.

Conclusion

Sen Jia's contributions to model training and body posture detection exemplify the impact of innovative thinking in technology. His patent reflects a commitment to enhancing the capabilities of detection systems, paving the way for future advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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