Tokyo, Japan

Seishiro Naruse

This inventor holds 1 USPTO granted patent. Top assignee: Oki Electric Industry Co., Ltd.. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seishiro Naruse. Retrieved from https://idiyas.com/inventor/seishiro-naruse

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Seishiro Naruse and His Patent for Picture-Image Signal Processing.

Introduction

Seishiro Naruse is an inventor associated with Tokyo, Japan, and Oki Electric Industry Co., Ltd. His patent work includes a circuit designed to determine an appropriate slice level when processing picture-image signals.

Latest Patents

Naruse is credited with 1 patent: “Slice Level Deciding Circuit.” The invention uses a slice-level generator to produce a variable slice level and a comparator to compare that level with a picture-image signal. When the comparator’s output meets a prescribed condition, an arithmetic circuit applies a specified value to determine an optimum slice level.

The circuit is intended to help prevent picture-image quality from deteriorating because of changes in light levels caused by ambient-temperature variations or noise encountered when reading portions of a medium that receive less light.

Career Highlights

Naruse’s documented patent activity reflects work on signal processing and image-reading technology. His invention addresses the challenge of maintaining image quality under changing illumination and noisy reading conditions.

Collaborations

Naruse is associated with Oki Electric Industry Co., Ltd. His listed coworker is Fumio Nakamura.

Conclusion

Seishiro Naruse’s patent describes a practical approach to selecting slice levels for picture-image signals, helping preserve image quality despite variations in illumination and reading noise.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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