Oshino, Japan

Seiji Ishii

This inventor holds 1 USPTO granted patent. Top assignee: Fanuc Corporation. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seiji Ishii. Retrieved from https://idiyas.com/inventor/seiji-ishii-tjliigsa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Seiji Ishii: Innovator in Numerical Control Technology

Introduction

Seiji Ishii is a prominent inventor based in Oshino-mura, Japan. He is known for his contributions to the field of numerical control technology. With a focus on enhancing the efficiency of machinery, Ishii has made significant strides in innovation.

Latest Patents

Ishii holds a patent for a "Speed control method for a numerical control apparatus." This invention aims to improve the precision and responsiveness of numerical control systems, which are essential in various manufacturing processes. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Seiji Ishii is currently employed at Fanuc Corporation, a leading company in automation and robotics. His work at Fanuc has allowed him to apply his innovative ideas in a practical setting, contributing to the advancement of technology in the industry.

Collaborations

Ishii has collaborated with notable colleagues, including Toshiaki Otsuki and Haruhiko Kozai. These partnerships have fostered a creative environment that encourages the development of cutting-edge solutions in numerical control technology.

Conclusion

Seiji Ishii's contributions to the field of numerical control technology highlight his innovative spirit and dedication to advancing machinery efficiency. His work continues to influence the industry, making him a noteworthy figure in the realm of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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