Otawara, Japan

Seiichiro Nagai

This inventor holds 1 USPTO granted patent. Top assignee: Canon Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seiichiro Nagai. Retrieved from https://idiyas.com/inventor/seiichiro-nagai-jizlrjp5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Seiichiro Nagai: Inventor of an X-Ray Disinfection System.

Introduction

Seiichiro Nagai is an inventor associated with Otawara, Japan, and Canon Kabushiki Kaisha. His work includes an invention that combines X-ray diagnostic equipment with ultraviolet disinfection.

Latest Patents

Nagai is associated with 1 patent: “X-ray Diagnosis Apparatus and Disinfection Method Using X-Ray Diagnosis Apparatus.” The disclosed apparatus includes a holder for an X-ray tube, a movable support, an ultraviolet emitter, a detector that identifies contact areas touched by a patient or examination technician, and a controller. The controller moves the tube holder to a position corresponding to a detected contact area and directs ultraviolet rays toward that area.

Career Highlights

The patent describes an approach to disinfecting contact surfaces as part of an X-ray examination workflow. By integrating ultraviolet irradiation into the diagnostic apparatus, the invention is designed to target areas that may have been touched during an examination.

Collaborations

Nagai’s listed coworkers include Junji Masahashi and Nobuo Kobayashi. His patent is associated with Canon Kabushiki Kaisha.

Conclusion

Seiichiro Nagai’s recorded patent presents an integrated X-ray and ultraviolet disinfection concept intended to address contact-surface hygiene in diagnostic settings.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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