Sakai, Japan

Seiichi Kobayashi

This inventor holds 1 USPTO granted patent. Top assignee: Daicel Corporation. Active years: 1980.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seiichi Kobayashi. Retrieved from https://idiyas.com/inventor/seiichi-kobayashi-tirwio8b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1980

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1 patent (USPTO):Explore Patents

Title: Seiichi Kobayashi: Inventor of a Cigarette-Filter Measurement Method

Introduction

Seiichi Kobayashi is an inventor associated with Sakai, Japan, and Daicel Corporation. His patent work addresses the measurement of physical properties in cigarette filters.

Latest Patents

Kobayashi is associated with 1 patent, titled “Method and an Apparatus for Conducting Measurements of Physical Properties.” The invention describes a method for measuring at least two properties of cigarette filters, such as air-permeation resistance, diameter, weight, hardness, and length.

The method uses multiple measuring devices to assess designated properties in parallel. Filter plugs are fed to the devices, measured simultaneously, and then transferred through the sequence as fresh plugs enter the first device. Measurement results are scanned in succession and stored in memory.

Career Highlights

Kobayashi’s documented patent contribution focuses on coordinating multiple measurements in a continuous process. The approach is designed to streamline the assessment of cigarette-filter properties.

Collaborations

Katsuharu Arisaka and Kiyoshi Higashio are identified as Kobayashi’s coworkers. The available information does not specify their roles in the patent.

Conclusion

Seiichi Kobayashi’s recorded invention combines parallel measurement and sequential handling to support efficient testing of cigarette-filter properties.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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