Chiba, Japan

Seiei Fujiwara

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seiei Fujiwara. Retrieved from https://idiyas.com/inventor/seiei-fujiwara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Seiei Fujiwara: Innovator in Software Testing

Introduction

Seiei Fujiwara is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of software testing, particularly through his innovative patent. His work focuses on enhancing the efficiency and reliability of software upgrades.

Latest Patents

Fujiwara holds a patent for the "Testing of Software Upgrade." This patent presents methods, computer program products, and systems that facilitate the inputting of a set of test transactions into a shadow production system. The process includes modifying a set of transactions from a production system and obtaining results from the inputting. This innovation aims to streamline the software upgrade process and ensure its effectiveness.

Career Highlights

Fujiwara is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technology and contribute to advancements in software development and testing.

Collaborations

Some of his notable coworkers include Kazumasa Kawaguchi and Reona Kondoh. Their collaboration fosters a creative environment that encourages innovation and the development of new ideas in software technology.

Conclusion

Seiei Fujiwara's contributions to software testing through his patent demonstrate his commitment to improving technology. His work at IBM and collaborations with talented colleagues further enhance his impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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