Muko, Japan

Seidai Ueda

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Nidec Drive Technology Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seidai Ueda. Retrieved from https://idiyas.com/inventor/seidai-ueda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Seidai Ueda: Inventor of a Wave Reducer Correction System

Introduction

Seidai Ueda is an inventor based in Muko, Japan. His work includes a patented technology for improving measurement correction in wave reducers, which are used in industrial machinery and drive systems.

Latest Patents

Ueda is associated with 1 patent: “Wave Reducer, Industrial Machine, Drive System, and Correction Method.” The invention describes a wave reducer with a cam, flex gear, internal gear, angle sensor, thrust sensor, and circuit. The angle sensor measures changes corresponding to the cam’s rotation, while the thrust sensor responds to force applied to the cam. The circuit uses the thrust sensor’s output to correct the angle sensor’s output, helping account for the effects of thrust force on angle measurement.

Career Highlights

Ueda is associated with Nidec Drive Technology Corporation. His patented work addresses sensing and correction in wave reducer systems, with potential applications in industrial machines and drive systems.

Collaborations

Ueda’s listed coworker is Daisuke Takagi. Their association reflects collaborative work connected with the wave reducer patent.

Conclusion

Seidai Ueda’s patent combines angle and thrust sensing to correct measurements in wave reducers, contributing to technology for industrial machinery and drive systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…