Yonago, Japan

Sei Furuichi

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Metals, Ltd.. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sei Furuichi. Retrieved from https://idiyas.com/inventor/sei-furuichi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: Sei Furuichi: Inventor of a High-Fatigue-Strength Metal Band Saw Material.

Introduction

Sei Furuichi is an inventor associated with Yonago, Japan, and Hitachi Metals, Ltd. His recorded patent concerns a metal band saw material designed for high fatigue strength.

Latest Patents

Furuichi’s listed patent is titled “Back Material of Metal Band Saw High in Fatigue Strength.” It describes a steel composition intended for the back material of a metal band saw. The composition includes specified ranges of carbon, chromium, vanadium, aluminum, and niobium, along with molybdenum and/or tungsten, with iron and impurities making up the balance. The patent sets limits on the combined molybdenum and tungsten content to support the material’s intended fatigue strength. The supplied information lists 1 patent for Furuichi.

Career Highlights

Furuichi’s recorded invention focuses on materials engineering for metal band saws. Its specified alloy composition reflects an effort to balance strength and fatigue performance in the saw’s back material.

Collaborations

The supplied information identifies Ryousei Ago and Kingo Kiyonaga as Furuichi’s coworkers. It does not specify their roles in the patent or the invention.

Conclusion

Sei Furuichi’s listed patent documents a specialized steel composition for metal band saw back material, highlighting his contribution to fatigue-resistant industrial materials.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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