This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Aixacct Systems Gmbh, Rwth Aachen. Active years: 2016.
Company Filing History:
1 out of 1 
1 out of 75 
Years Active: 2016
Title: Sebastian Ufer: Innovator in Charge Carrier Beam Technology
Introduction
Sebastian Ufer is a notable inventor based in Aachen, Germany. He has made significant contributions to the field of charge carrier beam technology. His innovative approach has led to the development of a unique method for determining beam parameters, which has implications for various applications in the industry.
Latest Patents
Ufer holds a patent for a "Method for determining beam parameters of a charge carrier beam, measuring device, and charge carrier beam device." This patent describes a method that involves guiding a charge carrier beam through a slit aperture arrangement. The measurement plane coordinates of the beam components that penetrate the slit aperture are determined, allowing for precise measurement of beam parameters.
Career Highlights
Throughout his career, Sebastian Ufer has worked with prominent organizations such as RWTH Aachen University and Aixacct Systems GmbH. His experience in these institutions has provided him with a solid foundation in research and development, particularly in the area of charge carrier beams.
Collaborations
Ufer has collaborated with various professionals in his field, including his coworker Jens De Vries. These collaborations have further enhanced his work and contributed to advancements in charge carrier beam technology.
Conclusion
Sebastian Ufer's innovative contributions to charge carrier beam technology and his patent for a method of determining beam parameters highlight his role as a significant inventor in this field. His work continues to influence advancements in technology and research.