Neufahrn, Germany

Sebastian Eichinger

This inventor holds 1 USPTO granted patent. Top assignee: Bayerische Motoren Werke Aktiengesellschaft. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sebastian Eichinger. Retrieved from https://idiyas.com/inventor/sebastian-eichinger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Sebastian Eichinger: Inventor in Automotive Safety

Introduction

Sebastian Eichinger is an inventor based in Neufahrn, Germany. His patent work includes a device designed to detect deformation in a motor vehicle’s high-voltage accumulator housing.

Latest Patents

Eichinger is associated with 1 patent: “Detection device for detecting a deformation of a housing of a high-voltage accumulator of a motor vehicle.” The invention uses a substantially flat sensor element attached at least partially to one component of the accumulator. An evaluation device analyzes an electrical measurement variable between the sensor element and a second component, whose surface includes an electrically conductive region. Based on that measurement, the device can issue a warning when it detects mechanical deformation.

Career Highlights

Eichinger is associated with Bayerische Motoren Werke Aktiengesellschaft (BMW). His patent focuses on monitoring the structural condition of a high-voltage accumulator, a component used in electric vehicles.

Collaborations

The provided information identifies Jan Philipp Schmidt and Tobias Schmieg as Eichinger’s coworkers.

Conclusion

Sebastian Eichinger’s documented invention applies electrical sensing and evaluation to detect potential deformation in a vehicle battery housing and provide a corresponding warning.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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