Company Filing History:
Years Active: 2013
Title: Sean Kellog - Innovator in Charged Particle Beam Systems
Introduction
Sean Kellog is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of charged particle beam systems, particularly through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of focused ion beam (FIB) systems.
Latest Patents
Sean Kellog holds a patent for a "Charged particle beam system having multiple user-selectable operating modes." This invention outlines a method for performing milling and imaging in a focused ion beam system that employs an inductively-coupled plasma ion source. The patent details two sets of operating parameters: one optimized for milling and the other for imaging. These parameters include gas pressure, RF power, ion extraction voltage, and various settings within the FIB system ion column. The optimized milling process allows for rapid material removal, while the imaging process minimizes material removal and enhances spatial resolution.
Career Highlights
Throughout his career, Sean has demonstrated a commitment to advancing technology in the field of ion beam systems. His innovative approach has led to the development of methods that significantly improve both milling and imaging capabilities. His work is recognized for its practical applications in various industries.
Collaborations
Sean Kellog has collaborated with talented individuals such as Shouyin Zhang and Tom Miller. These partnerships have contributed to the successful development and implementation of his innovative ideas.
Conclusion
Sean Kellog's contributions to the field of charged particle beam systems exemplify the impact of innovation in technology. His patent and collaborative efforts continue to influence advancements in focused ion beam systems.