Location History:
- Anyang, KR (2002 - 2003)
- Gyeonggi-do, KR (2011)
Company Filing History:
Years Active: 2002-2011
Title: Se-Jang Oh: Innovator in Semiconductor Testing Technology
Introduction
Se-Jang Oh is a prominent inventor based in Anyang, South Korea. He has made significant contributions to the field of semiconductor testing, holding a total of 4 patents. His innovative work focuses on enhancing the efficiency and reliability of semiconductor testing processes.
Latest Patents
Se-Jang Oh's latest patents include a wireless interface probe card for high-speed one-shot wafer testing and a semiconductor testing apparatus. The wireless interface probe card features a substrate member with multiple probe terminals that directly contact semiconductor chip pads on a wafer. This design allows for efficient testing of semiconductor chips. Additionally, his patent for a tester of semiconductor memory devices outlines a method for recording and comparing test patterns, detecting defects, and generating addresses for testing, thereby improving the reliability of test results.
Career Highlights
Se-Jang Oh is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in semiconductor technology. His work has been instrumental in advancing testing methodologies that enhance the performance and reliability of semiconductor devices.
Collaborations
Throughout his career, Se-Jang Oh has collaborated with notable colleagues, including Ki-sang Kang and Seok-ho Park. These partnerships have contributed to the development of cutting-edge technologies in the semiconductor industry.
Conclusion
Se-Jang Oh's contributions to semiconductor testing technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in the field and provide solutions that enhance testing efficiency and reliability.