Andover, CT, United States of America

Scott P Snietka

This inventor holds 4 USPTO granted patents. Top assignee: Gerber Systems Corporation. Active years: 1992-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Scott P Snietka. Retrieved from https://idiyas.com/inventor/scott-p-snietka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 4

Forward Citations = 102(Granted Patents)


Location History:

  • Plantsville, CT (US) (1992)
  • Andover, CT (US) (1996 - 1997)

Company Filing History:


Years Active: 1992-1997

Loading Chart...
4 patents (USPTO):Explore Patents

Title: The Innovations of Scott P. Snietka

Introduction

Scott P. Snietka is a notable inventor based in Andover, Connecticut. He has made significant contributions to the field of optical inspection systems, particularly in the context of printed circuit board (PCB) defect detection. With a total of four patents to his name, Snietka's work has advanced the technology used in quality control processes.

Latest Patents

One of Scott P. Snietka's latest patents is an automatic optical inspection system that utilizes a weighted transition database. This method and apparatus generate a reference database image of a PCB, incorporating tolerances for each individual feature. The invention is characterized by a tolerance database that includes at least three states, where each color is weighted, and adjacent pixels are grouped into arrays or 'bins'. An error signal is produced when the sum of the pixel weights in a bin surpasses a preselected threshold. This innovative approach enhances the accuracy of defect detection in PCBs.

Career Highlights

Scott P. Snietka is currently employed at Gerber Systems Corporation, where he continues to develop cutting-edge technologies in the field of optical inspection. His expertise and innovative mindset have positioned him as a key player in the industry.

Collaborations

Throughout his career, Snietka has collaborated with notable colleagues, including Ronald J. Straayer and Peter M. Walsh. These partnerships have contributed to the advancement of technology in their respective fields.

Conclusion

Scott P. Snietka's contributions to the field of optical inspection systems demonstrate his commitment to innovation and quality in technology. His patents reflect a deep understanding of the complexities involved in PCB defect detection, making him a valuable asset to the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…