Scott P Lockledge

Title: Scott P Lockledge: Innovator in Scanning Probe and Electron Microscope Technology

Introduction

Scott P Lockledge is a notable inventor based in West Chester, PA (US). He has made significant contributions to the field of microscopy through his innovative patents. With a total of seven patents to his name, Lockledge has established himself as a key figure in the development of advanced probe technologies.

Latest Patents

Lockledge's latest patents focus on the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. The methods described involve mounting multiple wires on a stage and ion milling them simultaneously. This process is conducted while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are characterized by their highly uniform probe tips, which possess controllable properties for stable and accurate measurements in scanning probe and electron microscopy.

Career Highlights

Throughout his career, Lockledge has worked with various companies, including Lutek, LLC and Tiptek, LLC. His experience in these organizations has contributed to his expertise in the field of microscopy and probe technology.

Collaborations

Lockledge has collaborated with notable individuals in his field, including Darrell W Brownawell and Joseph W Lyding. These collaborations have further enhanced his work and contributions to the industry.

Conclusion

Scott P Lockledge is a distinguished inventor whose work in scanning probe and electron microscope technology has had a significant impact on the field. His innovative methods for manufacturing probe tips demonstrate his commitment to advancing scientific measurement techniques.