Palo Alto, CA, United States of America

Scott Hsieh


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Scott Hsieh: Innovator in Truncation Artifact Correction

Introduction

Scott Hsieh is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of medical imaging through his innovative work. His expertise lies in developing systems and methods that enhance the accuracy of imaging techniques.

Latest Patents

Scott Hsieh holds a patent for "Systems and methods for performing truncation artifact correction." This patent describes a method that involves acquiring a projection dataset of a patient, which includes both measured and truncated data. The process generates an initial estimate of the boundary between these data types, revises this estimate using the measured data, and ultimately estimates the truncated data. The final step involves using both the measured and estimated truncated data to create an image of the patient.

Career Highlights

Scott Hsieh is associated with General Electric Company, where he applies his skills in medical imaging technology. His work has been instrumental in improving the quality of diagnostic images, which is crucial for patient care.

Collaborations

Throughout his career, Scott has collaborated with esteemed colleagues such as Norbert Joseph Pelc and Brian Edward Nett. These partnerships have fostered advancements in imaging technologies and methodologies.

Conclusion

Scott Hsieh's contributions to truncation artifact correction represent a significant advancement in medical imaging. His innovative methods enhance the accuracy of patient imaging, ultimately benefiting healthcare outcomes.

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