The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Nov. 02, 2012
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Scott Hsieh, Palo Alto, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
Brian Edward Nett, Madison, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G06T 2211/432 (2013.01);
Abstract
A method for performing truncation artifact correction includes acquiring a projection dataset of a patient, the projection dataset including measured data and truncated data, generating an initial estimate of a boundary between the measured data and the truncated data, using the measured data to revise the initial estimate of the boundary, estimating the truncated data using the revised estimate of the boundary, and using the measured data and the estimated truncated data to generate an image of the patient.