This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: University of Pennsylvania. Active years: 2010-2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010-2019
Title: Scott Dean Metzler: Innovator in Imaging Technology
Introduction
Scott Dean Metzler is a notable inventor based in Haddonfield, NJ (US). He has made significant contributions to the field of imaging technology, holding a total of 2 patents. His work focuses on enhancing imaging techniques, which have important applications in medical and scientific fields.
Latest Patents
Metzler's latest patents include an "Apparatus and method for collecting super-sampled imaging data." This invention features an imaging scanner with multiple detectors arranged around a scanner axis, along with a bed that is oriented at a specific angle to optimize data collection. The design allows for additional information to be acquired during scans by translating the bed along different axes. Another significant patent is for "Slit-slat collimation," which combines the resolution and sensitivity of pinhole Single Photon Emission Computed Tomography (SPECT) imaging with the complete-sampling properties of fan-beam collimators.
Career Highlights
Scott Dean Metzler is affiliated with the University of Pennsylvania, where he continues to advance his research and development in imaging technologies. His innovative approaches have positioned him as a key figure in the field.
Collaborations
Metzler has collaborated with esteemed colleagues such as Roberto Accorsi and Robert M Lewitt, contributing to the advancement of imaging techniques through shared expertise and innovative ideas.
Conclusion
Scott Dean Metzler's contributions to imaging technology through his patents and collaborations highlight his role as an influential inventor in the field. His work continues to impact the way imaging data is collected and utilized in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
