Kawasaki Kanagawa, Japan

Sayuri Suzuki

This inventor holds 1 USPTO granted patent. Top assignees: Kabushiki Kaisha Toshiba, Toshiba Information Systems (Japan) Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sayuri Suzuki. Retrieved from https://idiyas.com/inventor/sayuri-suzuki-pha69d9o

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sayuri Suzuki: Innovator in Optical Inspection Technology

Introduction

Sayuri Suzuki is a prominent inventor based in Kawasaki, Kanagawa, Japan. She has made significant contributions to the field of optical inspection technology. With a focus on innovation, she has developed methods and apparatuses that enhance the efficiency and accuracy of optical inspections.

Latest Patents

Sayuri Suzuki holds a patent for an "Optical Inspection Method, Non-Transitory Storage Medium, and Optical Inspection Apparatus." This invention represents her commitment to advancing technology in the optical inspection domain. The patent showcases her ability to create solutions that address industry needs.

Career Highlights

Throughout her career, Sayuri has worked with notable companies, including Kabushiki Kaisha Toshiba and Toshiba Information Systems Corporation. Her experience in these organizations has allowed her to refine her skills and contribute to various innovative projects.

Collaborations

Sayuri has collaborated with talented individuals in her field, including her coworker Hiroya Kano. Their partnership has fostered creativity and innovation in their projects.

Conclusion

Sayuri Suzuki is a remarkable inventor whose work in optical inspection technology has made a lasting impact. Her dedication to innovation and collaboration continues to inspire others in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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