Somerville, MA, United States of America

Sayed Mazdak Abulnaga

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Ai Optics Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sayed Mazdak Abulnaga. Retrieved from https://idiyas.com/inventor/sayed-mazdak-abulnaga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sayed Mazdak Abulnaga: Medical Imaging Innovation

Introduction

Sayed Mazdak Abulnaga is an inventor based in Somerville, Massachusetts. His work includes a patent for assessing image quality in medical diagnostic systems, and he is associated with Ai Optics Inc.

Latest Patents

Abulnaga is named on 1 patent, titled “Assessment of Image Quality for a Medical Diagnostics Device.” The invention describes a system that evaluates a medical image representation using both image-quality assessment and a disease-detection machine-learning model. It determines a quality score based on the representation’s quality and the model’s certainty measure, then can discard representations that do not meet the system’s criteria. Combining these machine-learning functions may improve image-quality analysis, speed up medical imaging, and reduce the need to retake images or repeat imaging procedures.

Career Highlights

The patent focuses on making medical diagnostic imaging more efficient while maintaining system performance. The described approach aims to make image assessment faster and more robust by reducing unnecessary retakes.

Collaborations

Abulnaga is associated with Ai Optics Inc. His listed coworkers include Benjamin Jj Villard and Luke Michael Moretti.

Conclusion

Sayed Mazdak Abulnaga’s patented work applies machine learning to medical image assessment, with the goal of improving diagnostic imaging efficiency and reducing repeat scans.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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