Nashik, India

Sayali Patil


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Sayali Patil: Innovator in Chaos Engineering

Introduction

Sayali Patil is a notable inventor based in Nashik, India. She has made significant contributions to the field of chaos engineering, particularly through her innovative patent. Her work focuses on enhancing the testing environments of computing systems, which is crucial for ensuring their reliability and performance.

Latest Patents

Sayali Patil holds a patent titled "Intent-based chaos level creation to variably test environments." This method involves receiving initial input parameters at a chaos level engine. The chaos level engine then determines scaled input parameters that define how these initial parameters affect the computing environment being tested. Furthermore, the chaos level engine establishes a chaos level for conducting a chaos experiment based on the scaled input parameters. The chaos level is then sent to the computing environment for the experiment. After the experiment, feedback is received from the computing environment, detailing the impact caused by the chaos experiment and the intended level of chaos. This innovative approach allows for more effective testing of computing environments.

Career Highlights

Sayali is currently employed at Cisco Technology, Inc., where she applies her expertise in chaos engineering. Her role involves developing methods and systems that enhance the resilience of computing environments.

Collaborations

Throughout her career, Sayali has collaborated with talented individuals such as Marisol Palmero Amador and Kanishka Priyadharshini Annamali. These collaborations have contributed to her success and the advancement of her projects.

Conclusion

Sayali Patil is a pioneering inventor whose work in chaos engineering is shaping the future of computing environments. Her innovative patent demonstrates her commitment to improving system reliability through advanced testing methods.

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