Mountain View, CA, United States of America

Saurabh Vashisth

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Rubrik, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Saurabh Vashisth. Retrieved from https://idiyas.com/inventor/saurabh-vashisth

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Saurabh Vashisth: Innovator in Data Management

Introduction

Saurabh Vashisth is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of data management, particularly in backup systems. His innovative approach has led to the development of a patented method that enhances data validation processes.

Latest Patents

Saurabh holds a patent for "End-to-end data validation for backup systems." This patent describes methods, systems, and devices for effective data management. The method involves obtaining a first fingerprint of data blocks from a source data system and a second fingerprint from a backup system. By comparing these fingerprints, the system validates whether the data objects are stored correctly in the backup system.

Career Highlights

Saurabh Vashisth is currently employed at Rubrik, Inc., where he continues to innovate in the realm of data management. His work focuses on improving the reliability and efficiency of backup systems, ensuring that data integrity is maintained.

Collaborations

Saurabh collaborates with Prasanta Ranjan Dash, working together to advance their projects and contribute to the field of data management.

Conclusion

Saurabh Vashisth's contributions to data management through his innovative patent demonstrate his expertise and commitment to enhancing backup systems. His work at Rubrik, Inc. continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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