Zionsville, IN, United States of America

Satyalinga S Gampala

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Dow Agrosciences LLC. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satyalinga S Gampala. Retrieved from https://idiyas.com/inventor/satyalinga-s-gampala

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Satyalinga S Gampala: Innovator in Plant Genetic Analysis

Introduction

Satyalinga S Gampala is a notable inventor based in Zionsville, IN (US). He has made significant contributions to the field of plant genetics through his innovative work. His expertise lies in the analysis of plant materials, particularly in detecting unique genetic elements.

Latest Patents

Satyalinga holds a patent titled "System and method for analysis of plant material for a set of unique exogenous genetic elements." This patent focuses on a system and method for detecting heterologous DNA in plant materials. His work is crucial for advancing agricultural biotechnology and improving crop resilience.

Career Highlights

Satyalinga is currently employed at Dow Agrosciences LLC, where he applies his knowledge and skills to develop cutting-edge solutions in agricultural science. His work at the company has positioned him as a key player in the field of plant genetic research.

Collaborations

He has collaborated with notable colleagues, including John P Davies and Warren S Lee, to further enhance the impact of his research and innovations.

Conclusion

Satyalinga S Gampala's contributions to plant genetic analysis exemplify the importance of innovation in agriculture. His work not only advances scientific understanding but also has practical applications that can benefit the agricultural industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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