This inventor holds 1 USPTO granted patent. Top assignees: Hitachi Computer Engineering Co., Ltd., Hitachi, Ltd.. Active years: 1989.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 1989
Title: Satoshi Takemura: Innovator in Multi-Processor Testing Systems
Introduction
Satoshi Takemura is a notable inventor based in Hadano, Japan. He has made significant contributions to the field of multi-processor systems, particularly in testing methodologies. His innovative approach has led to the development of a unique patent that enhances the efficiency of multi-processor testing.
Latest Patents
Takemura holds a patent for a "Method and apparatus for testing a multi-processor system." This invention addresses the challenges of testing systems that include multiple processors and peripheral devices, such as input/output (I/O) devices. The method allows processors to access specified I/O devices in parallel, improving testing efficiency. The apparatus features multiple I/O control tables that store status information of the I/O devices and a scheduler that manages access between processors and I/O devices. A lock control flag is utilized to indicate whether an I/O device is locked by a processor, allowing for optimized testing through the selection of accessible processors.
Career Highlights
Throughout his career, Satoshi Takemura has worked with prominent companies, including Hitachi, Ltd. and Hitachi Computer Engineering Co., Ltd. His experience in these organizations has contributed to his expertise in multi-processor systems and testing methodologies.
Collaborations
Takemura has collaborated with notable colleagues, including Kohei Fukuoka and Yatao Takesue. These partnerships have likely enriched his work and contributed to advancements in the field.
Conclusion
Satoshi Takemura's contributions to multi-processor testing systems through his innovative patent demonstrate his significant impact on the field. His work continues to influence the development of efficient testing methodologies in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile