Kanagawa, Japan

Satoshi Narai

This inventor holds 21 USPTO granted patents and 8 published patent applications and 2 EPO patents, primarily in Image Processing Technology. Top assignee: Ricoh Company, Ltd.. Active years: 2012-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satoshi Narai. Retrieved from https://idiyas.com/inventor/satoshi-narai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 21 

% Patents Active = 42.9

 

Average Co-Inventor Count = 6.1

ph-index = 2

Forward Citations = 17(Granted Patents)


Location History:

  • Tokyo, JP (2014 - 2017)
  • Kanagawa, JP (2012 - 2023)

Company Filing History:


Years Active: 2012-2023

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Areas of Expertise:
Image Forming Apparatus
Handheld Mobile Printing Device
Automatic Document Feeder
Image Reading Device
Sheet Conveying Device
Image Scanner
Rotation Drive Device
Non-Transitory Computer-Readable Medium
Lighting Device
Image Reading Unit
Image Reading Readiness
Skew Correction
21 patents (USPTO):Explore Patents

Title: Inventor Satoshi Narai

Introduction: Satoshi Narai is a renowned inventor based in Kanagawa, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Satoshi Narai holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies.

Career Highlights: With over two decades of experience in the industry, Narai has worked with leading research institutions and universities to develop cutting-edge solutions for complex challenges.

Collaborations: Throughout his career, Satoshi Narai has collaborated with top companies in Japan and internationally, fostering innovation and pushing the boundaries of technology.

Conclusion: Satoshi Narai's dedication to innovation and his passion for creating a better future through technology make him a standout figure in the world of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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