Shizuoka, Japan

Satoshi Itaya

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satoshi Itaya. Retrieved from https://idiyas.com/inventor/satoshi-itaya-my6g7snz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Satoshi Itaya: Inventor in Control Systems

Introduction

Satoshi Itaya is an inventor associated with Shizuoka, Japan. His work includes a patented control-system invention, and the information provided lists Fujitsu Corporation as his company.

Latest Patents

The available information lists one patent for Itaya: “Control System, Control Device, Control Method, and Computer-Readable Recording Medium Storing Control Program.” The invention concerns control devices that perform nth-order transmission. Each device stores source and destination lists describing the control devices along a transmission path. When a device receives an update request, it updates its source list, generates a new request, and sends it to another control device. When it receives a completion response, it updates its destination list. The listed patent count is 1 patent.

Career Highlights

Itaya is associated with Fujitsu Corporation, a company whose work includes technology and computing. His listed patent focuses on coordinating updates and transmission paths among control devices.

Collaborations

Kenji Taka is identified as Itaya’s coworker. The available information does not specify their particular projects or collaborations.

Conclusion

Satoshi Itaya’s listed invention addresses the management of transmission paths and update processes in control systems, reflecting his connection to technology innovation at Fujitsu Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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