Aichi, Japan

Satoru Kuriki

USPTO Granted Patents = 3 

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2011-2015

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3 patents (USPTO):Explore Patents

Title: Satoru Kuriki: Innovator in Data Transfer Control Technology

Introduction

Satoru Kuriki is a notable inventor based in Aichi, Japan. He has made significant contributions to the field of data transfer control technology, holding a total of 3 patents. His work focuses on improving data transfer efficiency while effectively managing error data.

Latest Patents

Kuriki's latest patents include a data transfer control device and a data transfer control method. The data transfer control device is designed to enhance data transfer efficiency by discarding error data. It features a DMA parameter storing control unit that temporarily stores parameters to a storage resource. Additionally, a data processing unit performs error detection processing for transferred data. The device also includes a DMA parameter return control unit that returns parameters used during data transfer for subsequent use. Furthermore, a completion notification delay control unit ensures that completion notifications to the host system wait for the normal completion of data transfer.

Career Highlights

Throughout his career, Satoru Kuriki has worked with prominent companies, including Panasonic Intellectual Property Management Co., Ltd. and Panasonic Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in data transfer technology.

Collaborations

Kuriki has collaborated with notable colleagues such as Masaaki Harada and Yuusaku Ohta. Their teamwork has contributed to advancements in the field of data transfer control.

Conclusion

Satoru Kuriki's contributions to data transfer control technology highlight his innovative spirit and dedication to improving data efficiency. His patents and collaborations reflect his commitment to advancing technology in this critical area.

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