San Jose, CA, United States of America

Sateesh Bajikar

This inventor holds 1 USPTO granted patent. Top assignee: Maui Imaging, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sateesh Bajikar. Retrieved from https://idiyas.com/inventor/sateesh-bajikar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sateesh Bajikar and Ultrasound Imaging Innovation.

Introduction

Sateesh Bajikar is an inventor based in San Jose, California. His patent work concerns ultrasound imaging systems and methods, including techniques for locating reflectors within a target medium.

Latest Patents

The provided information lists one patent associated with Bajikar: Multiple Aperture Ultrasound Imaging Systems and Methods. The invention describes transmitting unfocused and diverging ultrasound signals from an apparent point source behind a concave probe surface, receiving echoes, and determining the location of a reflector. It calculates the total signal path using the distances from the source to the reflector and from the reflector to a receiving element, then identifies possible reflector locations and produces imaging data for the target medium. Bajikar is credited with 1 patent.

Career Highlights

Bajikar is associated with Maui Imaging, Inc. His listed patent reflects work on ultrasound imaging methods that use multiple apertures and signal-path calculations to help form data about a target medium.

Collaborations

The provided information names Elias M. Atmeh and Bruce R. Ritzi as Bajikar’s coworkers at Maui Imaging, Inc. Their shared company affiliation provides context for his professional environment, though no specific joint contributions are described.

Conclusion

Sateesh Bajikar’s listed patent focuses on methods for transmitting and analyzing ultrasound signals to determine reflector locations and generate imaging data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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