Prague, Czechia

Sarka Nemcova

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Ceske Vysoke Uceni Technicke V Praze Jugoslavskych Partyzanu. Active years: 2020.


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Sarka Nemcova: Innovator in Portable Measurement Devices

Introduction

Sarka Nemcova is a notable inventor based in Prague, Czech Republic. She has made significant contributions to the field of portable measurement devices, particularly in the area of surface reflectance data collection. Her innovative approach allows for enhanced data acquisition without the need for sample extraction.

Latest Patents

Sarka Nemcova holds a patent for a "Portable device for measuring the geometry of an object and its spatially varying surface reflectance on site." This invention focuses on a compact device that increases the amount of recorded imagery data of a measured object while maintaining a fixed position. The device captures spatially varying surface reflectance data, known as Bidirectional Texture Function data, and enables multidirectional imaging of real objects. It utilizes a basic three-dimensional object equipped with illumination units and optical elements, allowing for effective imaging and data acquisition on-site.

Career Highlights

Throughout her career, Sarka has worked at prestigious institutions, including the Czech Technical University in Prague. Her work has been instrumental in advancing the capabilities of portable measurement technologies.

Collaborations

Sarka has collaborated with notable colleagues such as Vlastimil Havran and Jan Hosek, contributing to various projects that enhance the understanding and application of measurement devices.

Conclusion

Sarka Nemcova's innovative work in portable measurement devices exemplifies her commitment to advancing technology in the field. Her contributions continue to impact the way surface reflectance data is collected and analyzed.

Profile summary based on public USPTO records.
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