This inventor holds 1 USPTO granted patent. Top assignee: Battelle Memorial Institute. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: The Innovative Mind of Sarah M Reehl
Introduction
Sarah M Reehl is a notable inventor based in Richland, Washington, recognized for her contributions to the field of analytical instruments. With one patent to her name, she is making strides in the world of electron microscopy, pushing the boundaries of how specimens can be analyzed.
Latest Patents
Her patent, titled "Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets," outlines innovative methods for sensing the conditions of an electron microscope system and the specimens analyzed within. This technology discloses sensor systems and electron microscope systems capable of detecting system conditions, as well as characteristics of the specimen itself. A key feature of her invention is the ability to acquire a sparse dataset through random sub-sampling utilizing an electron beam probe, enabling the estimation of instrument parameters and specimen characteristics from minimal data.
Career Highlights
Sarah currently serves at the Battelle Memorial Institute, a prominent research entity known for its advancements in scientific research and technological innovation. Her work there has placed her at the forefront of cutting-edge instrument development, showcasing her dedication to enhancing analytical capabilities within the scientific community.
Collaborations
In her innovative journey, Sarah has collaborated with respected colleagues, including Bryan A Stanfill and Margaret C Johnson. These collaborations emphasize the importance of teamwork in fostering breakthroughs in research and technology, allowing them to share expertise and tackle complex challenges in the realm of microscopy.
Conclusion
As a pioneering inventor, Sarah M Reehl is contributing valuable advancements in the field of analytical instrumentation. Her patent reflects a significant leap in how electron microscopy can be utilized and understood, potentially transforming research methodologies. The impact of her work is likely to resonate within the scientific community, inspiring future innovations in the area of instrumentation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile