Buchenbach, Germany

Sara Rentmeister

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Testo Ag. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sara Rentmeister. Retrieved from https://idiyas.com/inventor/sara-rentmeister

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2018

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sara Rentmeister: Innovator in Non-Contact Temperature Measurement

Introduction

Sara Rentmeister is a notable inventor based in Buchenbach, Germany. She has made significant contributions to the field of temperature measurement technology. Her innovative approach has led to the development of a unique device that enhances the accuracy of non-contact temperature measurements.

Latest Patents

Sara Rentmeister holds 1 patent for her invention titled "Device for Non-Contact Temperature Measurement and Temperature Measurement Method." This device incorporates an angle measuring device designed to measure the emission angle of the infrared radiation detected for temperature measurement. This advancement allows for precise measurements on the measuring region of an object emitting infrared radiation.

Career Highlights

Sara is currently employed at Testo AG, a company renowned for its expertise in measurement technology. Her work at Testo AG has positioned her as a key player in the development of innovative measurement solutions.

Collaborations

Sara collaborates with Jan-Friso Evers-Senne, contributing to the advancement of their projects and enhancing the overall innovation process.

Conclusion

Sara Rentmeister's contributions to non-contact temperature measurement technology exemplify her dedication to innovation. Her work continues to influence the field and improve measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…