Bengaluru, India

Sanjukta Biswas

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sanjukta Biswas. Retrieved from https://idiyas.com/inventor/sanjukta-biswas

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sanjukta Biswas and Wireless Network Mobility

Introduction

Sanjukta Biswas is an inventor based in Bengaluru, India, whose patent work addresses mobility measurement and handover procedures in wireless networks. The available information lists one patent associated with Biswas.

Latest Patents

Biswas’s patent, “Handling Layer 3 and LTM Measurement in Wireless Network,” describes a method for coordinating Layer 3 and Layer 1/Layer 2 Triggered Mobility (LTM) measurements. A user equipment device receives measurement-reporting configurations from a centralized unit, determines the relevant measurements, and checks whether they meet reporting criteria. Depending on the results, the device sends a Layer 3 measurement to the centralized unit or an LTM measurement to a distributed unit. This approach concerns how wireless systems manage measurement reporting for mobility.

Career Highlights

The provided information identifies Samsung Electronics Ltd. as Biswas’s company. The patent reflects work on wireless-network mobility and measurement reporting.

Collaborations

Jajohn Mathew Mattam is identified as Biswas’s coworker. The available details do not specify their roles or whether they collaborated on the patent.

Conclusion

Sanjukta Biswas’s listed patent focuses on coordinating mobility measurements and reporting in wireless networks, contributing to the technical work associated with Samsung Electronics Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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