Suwon, South Korea

Sangjune Bae

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Samsung Electronics Ltd., Semes Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sangjune Bae. Retrieved from https://idiyas.com/inventor/sangjune-bae-sg6gyuzl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sangjune Bae - Innovator in Rail Inspection Technology

Introduction

Sangjune Bae is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of rail inspection technology. His innovative approach has led to the development of a unique rail inspection device.

Latest Patents

Sangjune Bae holds 1 patent for his invention of a rail inspection device. This device is designed to enhance the efficiency and accuracy of rail inspections. It features a drive part that operates on a lower rail, side wheels for movement, upper wheels for contact with a branch guide rail, and an inclination sensor to measure the body's tilt.

Career Highlights

Throughout his career, Sangjune Bae has worked with prominent companies such as Semes Co., Ltd. and Samsung Electronics Ltd. His experience in these organizations has contributed to his expertise in developing innovative technologies.

Collaborations

Sangjune Bae has collaborated with talented individuals, including In Kyeong Hwang and Hyuk Jae Sung. These partnerships have fostered a creative environment that has led to advancements in his field.

Conclusion

Sangjune Bae's contributions to rail inspection technology exemplify his innovative spirit and dedication to improving safety in transportation. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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