Sangbong Lee

Title: The Innovative Contributions of Sangbong Lee

Introduction

Sangbong Lee is a notable inventor based in San Leandro, CA. He has made significant contributions to the field of residue detection systems. His work focuses on enhancing the accuracy and efficiency of identifying residues on various samples.

Latest Patents

Sangbong Lee holds a patent for a system that characterizes residue on a sample. This innovative residue detection system collects at least one of the spectrum and image from a measurement region on a sample. Spectral analysis is performed on the collected spectrum to determine whether residue is present and, if so, the thickness of the residue. The spectral analysis utilizes a calibration metric that correlates a monitoring parameter to the thickness of the residue. The monitoring parameter includes the reflectance value at one or more of the local minima and maxima in the spectrum, the shape of these local minima and maxima, and the difference in reflectance values between at least two of the local minima and maxima in the spectrum. In one embodiment, imaging analysis is performed on the collected image of the measurement region if no residue is detected by the spectral analysis.

Career Highlights

Sangbong Lee is currently employed at Nanometrics Inc., where he continues to develop innovative technologies. His work has contributed to advancements in the field of optical measurement and analysis.

Collaborations

Sangbong collaborates with talented coworkers, including Zhuan Liu and Jiangtao Hu. Their combined expertise fosters a creative environment that drives innovation.

Conclusion

Sangbong Lee's contributions to residue detection technology exemplify the impact of innovative thinking in scientific research. His patent reflects a commitment to improving measurement accuracy and efficiency.